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A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.
- Sales Rank: #3324710 in Books
- Published on: 1992-09
- Original language: English
- Number of items: 1
- Dimensions: 9.75" h x 7.25" w x 1.00" l,
- Binding: Hardcover
- 464 pages
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